Applied Scanning Probe Methods V

1. Front Matter

   Pages I-XLV

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2. Integrated Cantilevers and Atomic Force Microscopes

   • Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann

   Pages 1-22

3. Electrostatic Microscanner

   • Yasuhisa Ando

   Pages 23-49

4. Low-Noise Methods for Optical Measurements of Cantilever Deflections

   • Tilman E. Schäffer

   Pages 51-74

5. Q-controlled Dynamic Force Microscopy in Air and Liquids

   • Hendrik Hölscher, Daniel Ebeling, Udo D. Schwarz

   Pages 75-97

6. High-Frequency Dynamic Force Microscopy

   • Hideki Kawakatsu

   Pages 99-112

7. Torsional Resonance Microscopy and Its Applications

   • Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan

   Pages 113-148

8. Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy

   • Yaxin Song, Bharat Bhushan

   Pages 149-223

9. Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale

   • Justyna Wiedemair, Boris Mizaikoff, Christine Kranz

   Pages 225-267

10. New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

    • Robert Szoszkiewicz, Elisa Riedo

    Pages 269-286

11. Near-Field Raman Spectroscopy and Imaging

    • Pietro Giuseppe Gucciardi, Sebastiano Trusso, Cirino Vasi, Salvatore Patanè, Maria Allegrini

    Pages 287-329

12. Back Matter

    Pages 331-344

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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

• AFM
• PES
• REM
• Raman spectroscopy
• ceramics
• elasticity
• liquid
• microscopy
• modeling
• polymer
• spectroscopy

• Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, Columbus, USA

  Bharat Bhushan

• Department of Mathematics, Osaka City University, Graduate School of Science, Osaka, Japan

  Satoshi Kawata

• Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany

  Harald Fuchs

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