Editors:
- Presents critical reviews of the present position and future trends in modern chemical research concerned with chemical structure and bonding
- Short and concise reports, each written by the world's renowned experts
- Still valid and useful after 5 or 10 years
- More information as well as the electronic version of the whole content available at: springerlink.com
Part of the book series: Structure and Bonding (STRUCTURE, volume 118)
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Table of contents (4 chapters)
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Front Matter
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Back Matter
Reviews
"Studies of semiconductor nanocrystals remain a key component in the repertoire of materials chemistry. As these materials enjoy sustained relevance to applications in optoelectronic materials and biological labeling, updated, in-depth reviews of their fundamental properties continue to be a valuable resource to those interested in the field.
...this volume in the longstanding Structure and Bonding series is a useful compilation of up-to-date reviews regarding semiconductor nanocrystals, especially those of the often-studied II-VI variety. It also continues its tradition of choosing respected scientists in the field that produce lucid papers of value."
from: Jeffery L. Coffer, Texas Christian University, J. Am. Chem. Soc. 2006, 128, 9258
Bibliographic Information
Book Title: Semiconductor Nanocrystals and Silicate Nanoparticles
Editors: X. Peng, D. M. P. Mingos
Series Title: Structure and Bonding
DOI: https://doi.org/10.1007/b11020
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2005
Hardcover ISBN: 978-3-540-27805-4Published: 03 November 2005
Softcover ISBN: 978-3-642-06618-4Published: 12 February 2010
eBook ISBN: 978-3-540-31497-4Published: 22 September 2005
Series ISSN: 0081-5993
Series E-ISSN: 1616-8550
Edition Number: 1
Number of Pages: XII, 190
Topics: Inorganic Chemistry, Electrochemistry, Optical and Electronic Materials, Nanotechnology, Crystallography and Scattering Methods, Characterization and Evaluation of Materials