Overview
- Describes a powerful new method for investigating semiconductor layer structures
- Author is a leading expert in the field
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 209)
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Table of contents (14 chapters)
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Front Matter
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Back Matter
Keywords
About this book
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Bibliographic Information
Book Title: Infrared Ellipsometry on Semiconductor Layer Structures
Book Subtitle: Phonons, Plasmons, and Polaritons
Authors: Mathias Schubert
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/b11964
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-23249-0Published: 26 November 2004
Softcover ISBN: 978-3-642-06228-5Published: 23 November 2010
eBook ISBN: 978-3-540-44701-6Published: 01 March 2005
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: XI, 196
Topics: Classical Electrodynamics, Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Optics, Lasers, Photonics, Optical Devices, Engineering, general