Editors:
- Provides a single-source reference to sensing technologies for non-volatile memories (NVMs), enabling readers to compare sensing performance of various options
- Covers sensing techniques ranging from well-established NVMs such as hard disk, flash, Magnetic RAM (MRAM) to emerging NVMs such as ReRAM, STTRAM, FeRAM and Domain Wall Memory
- Highlights challenges common among memory technologies and their solutions in mature technology, guiding innovation of sensing technologies for future NVMs
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Table of contents (4 chapters)
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Front Matter
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Back Matter
About this book
This book introduces readers to the latest advances in sensing technology for a broad range of non-volatile memories (NVMs). Challenges across the memory technologies are highlighted and their solutions in mature technology are discussed, enabling innovation of sensing technologies for future NVMs. Coverage includes sensing techniques ranging from well-established NVMs such as hard disk, flash, Magnetic RAM (MRAM) to emerging NVMs such as ReRAM, STTRAM, FeRAM and Domain Wall Memory will be covered.
Editors and Affiliations
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School of Electrical Engineering and Computer Science, Pennsylvania State University, State College, USA
Swaroop Ghosh
About the editor
Dr. Ghosh was a senior research and development engineer in Advanced Design, Intel Corp from 2008 to 2012. At Intel, his research was focused on low power and robust embedded memory design in scaled technologies (32nm, 22nm and beyond). He has filed four US patents, published over 35 papers and authored a book chapter. Dr. Ghosh has served in the technical program committees of ISLPED, Nanoarch, VLSI Design, ISQED, ASQED, VLSI-SOC, IEDEC and NDCS.
His research interests include low-power, energy-efficient and robust circuit/system design and digital testing for nanometer technologies. Dr. Ghosh is a senior member of IEEE.
Bibliographic Information
Book Title: Sensing of Non-Volatile Memory Demystified
Editors: Swaroop Ghosh
DOI: https://doi.org/10.1007/978-3-319-97347-0
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing AG, part of Springer Nature 2019
Hardcover ISBN: 978-3-319-97345-6Published: 23 August 2018
Softcover ISBN: 978-3-030-07339-8Published: 19 January 2019
eBook ISBN: 978-3-319-97347-0Published: 10 August 2018
Edition Number: 1
Number of Pages: XIV, 107
Number of Illustrations: 29 b/w illustrations, 32 illustrations in colour
Topics: Circuits and Systems, Electronic Circuits and Devices, Memory Structures, Electronics and Microelectronics, Instrumentation