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Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

  • Book
  • © 2018

Overview

  • Provides comprehensive coverage for standard spectral testing
  • Includes accurate/linearity test methods with significantly relaxed requirements on precise instrumentation
  • Describes low-cost spectral/linearity testing methods, validated with independent measurements in industry test setup

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Table of contents (10 chapters)

Keywords

About this book

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

Authors and Affiliations

  • Qualcomm Inc, San Diego, USA

    Yuming Zhuang

  • Iowa State University, Ames, USA

    Degang Chen

About the authors

Yuming Zhuang is a Senior Product and Design Engineer in the Corporate R&D division, at Qualcomm Inc, in San Diego, California.

Degang Chen is the Jerry Junkins Chair Professor in the Department of Electrical and Computer Engineering, at Iowa State University, in Ames, Iowa.

Bibliographic Information

  • Book Title: Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

  • Authors: Yuming Zhuang, Degang Chen

  • DOI: https://doi.org/10.1007/978-3-319-77718-4

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer International Publishing AG, part of Springer Nature 2018

  • Hardcover ISBN: 978-3-319-77717-7Published: 13 April 2018

  • Softcover ISBN: 978-3-030-08520-9Published: 08 February 2019

  • eBook ISBN: 978-3-319-77718-4Published: 03 April 2018

  • Edition Number: 1

  • Number of Pages: XIV, 170

  • Number of Illustrations: 1 b/w illustrations, 88 illustrations in colour

  • Topics: Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation

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