Overview
- Provides new methods for calculating uncertainty of multiple indirect measurements
- Describes a simple method for estimating the systematic error in multiple measurements
- Presents a universal method for summation of systematic and random errors of measurement
- New edition includes methods for calculating inaccuracy of single measurements most widely used in practice, but largely neglected in traditional theory
- Now provides a step-by-step guide on how to evaluate measurement accuracy
- Serves as a short convenient reference for scientists in any field
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Measurement Science and Technology (SSMST)
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Table of contents (11 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This new edition adds a step-by-step guide on how to evaluate measurement accuracy and recommendations on how to calculate systematic error of multiple measurements. There is also an extended section on the method of reduction, which provides an alternative to the least-square method and the method of enumeration. Many sections are also rewritten to improve the structure and usability of the material. The 3rd edition reflects the latest developments in metrology and offers new results, and it is designed to be accessible to readers at various levels and positions, including scientists, engineers, and undergraduate and graduate students. By presenting material from a practical perspective and offering solutions and recommendations for problems that arise in conducting real-life measurements, author Semyon Rabinovich offers an invaluable resource for scientists in any field.
Authors and Affiliations
About the author
The first 16 years of Dr. Semyon Rabinovich’s career were spent in industry, where he created a number of electrical measuring instruments, including those that were mass-produced, as well as unique direct-voltage measuring instruments reaching the theoretical sensitivity limits. Following this, Dr. Rabinovich organized the Laboratory of Theoretical Metrology at the All-Union State Research Institute of Metrology (VNIIM) in the former USSR and was the head of this lab for the next 16 years. After a period in the aftermath of his decision to emigrate from the USSR when any reference to his name was a taboo, VNIIM now lists Dr. Rabinovich among their “renown scientists” in the theoretical metrology area. After moving to the USA, he took part in the work of two ISA Subcommittees in preparing ISA-RP67.04 “Setpoints for Nuclear Safety-Related Instrumentation” and “Methodologies for the Determination of Setpoints in Nuclear Safety-Related Instrumentation.” He has published six books and more than 100 other publications including 21 patents. Previously this book was published by American Institute of Physics.
Bibliographic Information
Book Title: Evaluating Measurement Accuracy
Book Subtitle: A Practical Approach
Authors: Semyon G. Rabinovich
Series Title: Springer Series in Measurement Science and Technology
DOI: https://doi.org/10.1007/978-3-319-60125-0
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2017
Hardcover ISBN: 978-3-319-60124-3Published: 15 September 2017
Softcover ISBN: 978-3-319-86785-4Published: 17 May 2018
eBook ISBN: 978-3-319-60125-0Published: 05 September 2017
Series ISSN: 2198-7807
Series E-ISSN: 2198-7815
Edition Number: 3
Number of Pages: XV, 323
Number of Illustrations: 22 b/w illustrations
Topics: Measurement Science and Instrumentation, Characterization and Evaluation of Materials, Quality Control, Reliability, Safety and Risk