Authors:
- Addresses a broad spectrum of analytical techniques in optical spectroscopy
- Presents a unique overview on methods and their expected outcome
- Provides practical information usually hidden in standard books about this topic
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 202)
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Table of contents (6 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Condensed Matter Physics, University of Valladolid, Valladolid, Spain
Juan Jimenez
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Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany
Jens W. Tomm
Bibliographic Information
Book Title: Spectroscopic Analysis of Optoelectronic Semiconductors
Authors: Juan Jimenez, Jens W. Tomm
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-319-42349-4
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing Switzerland 2016
Hardcover ISBN: 978-3-319-42347-0Published: 23 August 2016
Softcover ISBN: 978-3-319-82556-4Published: 14 June 2018
eBook ISBN: 978-3-319-42349-4Published: 16 August 2016
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XI, 307
Number of Illustrations: 113 b/w illustrations, 43 illustrations in colour
Topics: Semiconductors, Optics, Lasers, Photonics, Optical Devices, Microwaves, RF and Optical Engineering