Overview
- Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event transients and soft delays
- Presents closed form expressions for single event crosstalk noise, delay and speed-up effects
- Includes a reliability analysis of low power energy-efficient designs so that reader can make clever design choices that reduce static power consumption and improve soft error reliability
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Table of contents (9 chapters)
Keywords
About this book
Reviews
Authors and Affiliations
About the author
Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
Bibliographic Information
Book Title: Soft Error Mechanisms, Modeling and Mitigation
Authors: Selahattin Sayil
DOI: https://doi.org/10.1007/978-3-319-30607-0
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing Switzerland 2016
Hardcover ISBN: 978-3-319-30606-3Published: 04 March 2016
Softcover ISBN: 978-3-319-80848-2Published: 15 June 2018
eBook ISBN: 978-3-319-30607-0Published: 25 February 2016
Edition Number: 1
Number of Pages: XI, 105
Number of Illustrations: 46 b/w illustrations, 35 illustrations in colour
Topics: Circuits and Systems, Electronic Circuits and Devices, Processor Architectures