Overview
- With contributions by leaders in the field
- Provides a state-of-the-art review of the field and can serve as a reference for experts and beginners alike
- Describes analytical methods for defect studies
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 58)
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Table of contents (14 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.
Editors and Affiliations
Bibliographic Information
Book Title: Defects at Oxide Surfaces
Editors: Jacques Jupille, Geoff Thornton
Series Title: Springer Series in Surface Sciences
DOI: https://doi.org/10.1007/978-3-319-14367-5
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing Switzerland 2015
Hardcover ISBN: 978-3-319-14366-8Published: 16 March 2015
Softcover ISBN: 978-3-319-38019-3Published: 06 October 2016
eBook ISBN: 978-3-319-14367-5Published: 09 February 2015
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 1
Number of Pages: XVI, 462
Number of Illustrations: 107 b/w illustrations, 95 illustrations in colour
Topics: Surface and Interface Science, Thin Films, Optical and Electronic Materials, Surfaces and Interfaces, Thin Films, Physical Chemistry