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  • © 2014

Ferroelectric Domain Walls

Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy

Authors:

  • Nominated as an outstanding Ph.D. thesis by the University of Geneva, Switzerland
  • Easy-to-read descriptions of several AFM techniques
  • Thoroughly detailed methodologies and analysis accessible to non-experts
  • Includes a beginner-friendly introduction to disordered elastic systems
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Theses (Springer Theses)

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Table of contents (10 chapters)

  1. Front Matter

    Pages i-xv
  2. Introduction

    • Jill Guyonnet
    Pages 1-6
  3. Domain Walls in Ferroelectric Materials

    • Jill Guyonnet
    Pages 7-24
  4. Experimental Setup

    • Jill Guyonnet
    Pages 25-40
  5. Conclusions

    • Jill Guyonnet
    Pages 145-151
  6. Back Matter

    Pages 153-159

About this book

Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization. Due to the local symmetry-breaking caused by the change in polarization, domain walls are found to possess an unexpected lateral piezoelectric response, even when this is symmetry-forbidden in the parent material. This has interesting potential applications in electromechanical devices based on ferroelectric domain patterning. Moreover, electrical conduction is shown to arise at domain walls in otherwise insulating lead zirconate titanate, the first such observation outside of multiferroic bismuth ferrite, due to the tendency of the walls to localize defects. The role of defects is then explored in the theoretical framework of disordered elastic interfaces possessing a characteristic roughness scaling and complex dynamic response. It is shown that the heterogeneous disorder landscape in ferroelectric thin films leads to a breakdown of the usual self-affine roughness, possibly related to strong pinning at individual defects. Finally, the roles of varying environmental conditions and defect densities in domain switching are explored and shown to be adequately modelled as a competition between screening effects and pinning.

Authors and Affiliations

  • DPMC-MaNEP, University of Geneva, Geneva, Switzerland

    Jill Guyonnet

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access