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High-Bandwidth Memory Interface

  • Book
  • © 2014

Overview

Authors:
  1. Chulwoo Kim

    1. Department of Electrical Engineering #418 Engineering Bldg., Korea University, Seoul, Korea, Republic of (South Korea)

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  2. Hyun-Woo Lee

    1. SK-Hynix, Icheon-si, Korea, Republic of (South Korea)

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    You can also search for this author in PubMed   Google Scholar

  3. Junyoung Song

    1. Department of Electrical Engineering #418 Engineering Bldg., Korea University, Seoul, Korea, Republic of (South Korea)

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    You can also search for this author in PubMed   Google Scholar

  • Enables readers with minimal background in memory design to understand the basics of high-bandwidth memory interface design
  • Presents state-of-the-art techniques for memory interface design
  • Covers memory interface design at both the circuit level and system architecture level
  • Includes supplementary material: sn.pub/extras

Part of the book series: SpringerBriefs in Electrical and Computer Engineering (BRIEFSELECTRIC)

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Table of contents (5 chapters)

  1. Front Matter

    Pages i-viii
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  2. An Introduction to High-Speed DRAM

    • Chulwoo Kim, Junyoung Song, Hyun-Woo Lee
    Pages 1-11

  3. An I/O Line Configuration and Organization of DRAM

    • Chulwoo Kim, Junyoung Song, Hyun-Woo Lee
    Pages 13-24

  4. Clock Generation and Distribution

    • Chulwoo Kim, Junyoung Song, Hyun-Woo Lee
    Pages 25-49

  5. Transceiver Design

    • Chulwoo Kim, Junyoung Song, Hyun-Woo Lee
    Pages 51-76

  6. TSV Interface for DRAM

    • Chulwoo Kim, Junyoung Song, Hyun-Woo Lee
    Pages 77-86

  7. Back Matter

    Pages 87-88
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Keywords

About this book

This book provides an overview of recent advances in memory interface design at both the architecture and circuit levels. Coverage includes signal integrity and testing, TSV interface, high-speed serial interface including equalization, ODT, pre-emphasis, wide I/O interface including crosstalk, skew cancellation, and clock generation and distribution. Trends for further bandwidth enhancement are also covered.

Authors and Affiliations

  • Department of Electrical Engineering #418 Engineering Bldg., Korea University, Seoul, Korea, Republic of (South Korea)

    Chulwoo Kim, Junyoung Song

  • SK-Hynix, Icheon-si, Korea, Republic of (South Korea)

    Hyun-Woo Lee

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