Authors:
- Features in-depth coverage of numerical computation of electron microscopy images including multislice methods
- Covers high resolution CTEM and STEM image interpretation
- Addresses the latest developments in the field from the last decade
- Includes updated appendices with code in Octave
- Allows you to calculate images from first principles for specimens ranging from simple inorganic crystals to cryo-EM biological specimens
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (8 chapters)
-
Front Matter
-
Back Matter
About this book
Authors and Affiliations
-
School of Applied & Engineering Physics, Cornell University, Ithaca, USA
Earl J. Kirkland
About the author
Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.
Bibliographic Information
Book Title: Advanced Computing in Electron Microscopy
Authors: Earl J. Kirkland
DOI: https://doi.org/10.1007/978-3-030-33260-0
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer Nature Switzerland AG 2020
Hardcover ISBN: 978-3-030-33259-4Published: 10 March 2020
Softcover ISBN: 978-3-030-33262-4Published: 10 March 2021
eBook ISBN: 978-3-030-33260-0Published: 09 March 2020
Edition Number: 3
Number of Pages: XII, 354
Number of Illustrations: 138 b/w illustrations, 8 illustrations in colour
Topics: Spectroscopy and Microscopy, Image Processing and Computer Vision, Characterization and Evaluation of Materials, Biological Microscopy, Spectroscopy/Spectrometry