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Ageing of Integrated Circuits

Causes, Effects and Mitigation Techniques

  • Book
  • © 2020

Overview

Editors:
  1. Basel Halak

    1. The School of Electronics and Computer Science, University of Southampton, Southampton, UK

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  • Describes in detail the physical mechanisms of CMOS ageing
  • Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits
  • Presents state-of-the art synthesis algorithms for ageing resilient digital systems
  • Introduces application-dependent techniques to mitigate the effects of aging
  • Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems
  • Includes more than 200 references on state-of-art research in this area, providing direction for further reading

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-xiii
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  2. Ageing Physical Mechanisms and Effects

    1. Front Matter

      Pages 1-1
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    2. Understanding Ageing Mechanisms

      • Domenik Helms
      Pages 3-34

    3. The Effects of Ageing on the Reliability and Performance of Integrated Circuits

      • Daniele Rossi
      Pages 35-64

  3. Ageing Mitigation Techniques

    1. Front Matter

      Pages 65-65
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    2. Aging Mitigation Techniques for Microprocessors Using Anti-aging Software

      • Haider Muhi Abbas, Mark Zwolinski, Basel Halak
      Pages 67-89

    3. Ageing Mitigation Techniques for SRAM Memories

      • Mohd Syafiq Mispan, Mark Zwolinski, Basel Halak
      Pages 91-111

    4. Ageing-Aware Logic Synthesis

      • Shengyu Duan, Mark Zwolinski, Basel Halak
      Pages 113-145

  4. Ageing Monitoring and Adaptation Techniques

    1. Front Matter

      Pages 147-147
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    2. On-Chip Ageing Monitoring and System Adaptation

      • Lorena Anghel, Florian Cacho, Riddhi Jitendrakumar Shah
      Pages 149-180

    3. Aging Monitors for SRAM Memory Cells and Sense Amplifiers

      • Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas
      Pages 181-210

    4. A Cost-Efficient Aging Sensor Based on Multiple Paths Delay Fault Monitoring

      • Gaole Sai, Mark Zwolinski, Basel Halak
      Pages 211-223

  5. Back Matter

    Pages 225-228
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Keywords

About this book

This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.  


Editors and Affiliations

  • The School of Electronics and Computer Science, University of Southampton, Southampton, UK

    Basel Halak

About the editor

Basel Halak is the director of the Embedded Systems Master program at Southampton University. He is a member of the Sustainable Electronics Research group, as well as, Cyber Security group at Electronics and Computer Science School (ECS). He has written over 60 conference and journal papers, and authored two books. He has received his PhD degree in Microelectronics System Design from Newcastle University. He was then awarded a knowledge transfer fellowship to develop secure and energy efficient design for portable health care monitoring systems. His background is on the design and implementation of microelectronics systems, with special focus on developing secure hardware implementation for cryptographic primitives such as physically unclonable functions.  Dr Halak lectures on digital design, Secure Hardware and Cryptography, supervises a number of MSc and PhD students, and leading the European Masters in Embedded Computing Systems (EMECS). He is the recipient of the Vice Chancellor Teaching Award in 2016, and the bronze leaf award in IEEE PRIME conference for his paper on current-based physically unclonable functions. He is a senior fellow of the Higher Education Academy (HEA), a guest editor of the IET CDT, and serves on several technical program committees such as IEEE ICCCA, ICCCS, MTV, IVSW, MicDAT and EWME. He is also member of hardware security working group of the World Wide Web Consortium (W3C).

Bibliographic Information

  • Book Title: Ageing of Integrated Circuits

  • Book Subtitle: Causes, Effects and Mitigation Techniques

  • Editors: Basel Halak

  • DOI: https://doi.org/10.1007/978-3-030-23781-3

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Nature Switzerland AG 2020

  • Hardcover ISBN: 978-3-030-23780-6Published: 11 October 2019

  • Softcover ISBN: 978-3-030-23783-7Published: 12 October 2020

  • eBook ISBN: 978-3-030-23781-3Published: 30 September 2019

  • Edition Number: 1

  • Number of Pages: XIII, 228

  • Number of Illustrations: 38 b/w illustrations, 107 illustrations in colour

  • Topics: Circuits and Systems, Processor Architectures, Electronics and Microelectronics, Instrumentation

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