Overview
- Presents cutting edge real time imaging techniques for broad fields of materials science
- Introduces types, basics, and applications of the state of the art real time imaging techniques for materials science studies
- Features a wide range of materials science categories featuring real time imaging techniques especially under non-ambient conditions including elevated temperatures, controlled atmospheres, and mechanical stresses
Part of the book series: The Minerals, Metals & Materials Series (MMMS)
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Table of contents (14 papers)
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Energy, Fuels, and Environment
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Thermodynamic and Mechanical Properties
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Additive Manufacturing and Biomaterials
Keywords
About this book
“Real time” imaging techniques have assisted materials science studies especially for non-ambient environments. These techniques have never been collectively featured in a single venue. The book is an assembly of materials studies utilizing cutting edge real time imaging techniques, emphasizing the significance and impact of those techniques.
Editors and Affiliations
About the editors
Bibliographic Information
Book Title: Advanced Real Time Imaging II
Book Subtitle: Cutting-Edge Techniques in Materials Science Studies
Editors: Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, … Bryan Webler
Series Title: The Minerals, Metals & Materials Series
DOI: https://doi.org/10.1007/978-3-030-06143-2
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: The Minerals, Metals & Materials Society 2019
Hardcover ISBN: 978-3-030-06142-5Published: 09 February 2019
eBook ISBN: 978-3-030-06143-2Published: 08 February 2019
Series ISSN: 2367-1181
Series E-ISSN: 2367-1696
Edition Number: 1
Number of Pages: XII, 154
Number of Illustrations: 32 b/w illustrations, 54 illustrations in colour
Topics: Characterization and Evaluation of Materials, Materials Engineering, Optical and Electronic Materials, Optics, Lasers, Photonics, Optical Devices, Spectroscopy and Microscopy