Advanced Transmission Electron Microscopy

1. Front Matter

   Pages i-xxvi

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2. Introduction and Historical Background

   • Jian Min Zuo, John C. H. Spence

   Pages 1-18

3. Electron Waves and Wave Propagation

   • Jian Min Zuo, John C. H. Spence

   Pages 19-47

4. The Geometry of Electron Diffraction Patterns

   • Jian Min Zuo, John C. H. Spence

   Pages 49-75

5. Kinematical Theory of Electron Diffraction

   • Jian Min Zuo, John C. H. Spence

   Pages 77-100

6. Dynamical Theory of Electron Diffraction for Perfect Crystals

   • Jian Min Zuo, John C. H. Spence

   Pages 101-141

7. Electron Optics

   • Jian Min Zuo, John C. H. Spence

   Pages 143-164

8. Lens Aberrations and Aberration Correction

   • Jian Min Zuo, John C. H. Spence

   Pages 165-191

9. Electron Sources

   • Jian Min Zuo, John C. H. Spence

   Pages 193-206

10. Electron Detectors

    • Jian Min Zuo, John C. H. Spence

    Pages 207-229

11. Instrumentation and Experimental Techniques

    • Jian Min Zuo, John C. H. Spence

    Pages 231-295

12. Crystal Symmetry

    • Jian Min Zuo, John C. H. Spence

    Pages 297-346

13. Crystal Structure and Bonding

    • Jian Min Zuo, John C. H. Spence

    Pages 347-401

14. Diffuse Scattering

    • Jian Min Zuo, John C. H. Spence

    Pages 403-440

15. Atomic Resolution Electron Imaging

    • Jian Min Zuo, John C. H. Spence

    Pages 441-499

16. Imaging and Characterization of Crystal Defects

    • Jian Min Zuo, John C. H. Spence

    Pages 501-552

17. Strain Measurements and Mapping

    • Jian Min Zuo, John C. H. Spence

    Pages 553-580

18. Structure of Nanocrystals, Nanoparticles, and Nanotubes

    • Jian Min Zuo, John C. H. Spence

    Pages 581-652

19. Back Matter

    Pages 653-729

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This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.

• Crystal Structure Refinement
• Electron Diffraction Geometry
• Electron Diffraction Theory
• Electron Nanodiffraction
• Large Angle Methods and Defects
• Precession Electron Diffraction
• Scanning Electron Diffraction
• Single Crystal CBED Patterns
• Ultrafast Electron Diffraction

“This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy … . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work.” (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)

• Frederick-Seitz Materials Research Laboratory, Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, USA

  Jian Min Zuo

• Department of Physics, Arizona State University, Tempe, USA

  John C.H. Spence

Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society.


John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).

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