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Field-Ion Microscopy

  • Book
  • © 1968

Overview

Editors:
  1. John J. Hren

    1. Department of Metallurgical and Materials Engineering, University of Florida, Gainesville, USA

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  2. S. Ranganathan

    1. Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley, USA

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    You can also search for this editor in PubMed   Google Scholar

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Table of contents (12 chapters)

  1. Front Matter

    Pages i-xiv
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  2. The Theoretical and Technical Development of Field-Ion Microscopy

    • E. W. Müller
    Pages 1-5

  3. Field Emission and Field Ionization

    • M. J. Southon
    Pages 6-27

  4. Field Evaporation

    • D. G. Brandon
    Pages 28-52

  5. Gas Impact, Field Etching, and Field Deformation

    • D. G. Brandon
    Pages 53-68

  6. Some Geometrical Aspects of Surfaces Related to Field-Ion Microscopy

    • A. J. W. Moore
    Pages 69-87

  7. Artifacts, Hydrogen Promotion, and Field-Ion Microscopy of Nonrefractory Metals

    • E. W. Müller
    Pages 88-101

  8. Interpretation of Field-Ion Microscope Images of Point and Line Defects

    • J. J. Hren
    Pages 102-119

  9. Field-Ion Microscope Studies of Planar Faults

    • S. Ranganathan
    Pages 120-136

  10. Field-Ion Microscope Studies of Interfaces

    • S. Ranganathan
    Pages 137-156

  11. Experimental Studies of Alloys with Field-Ion Microscope

    • B. Ralph
    Pages 157-170

  12. Field-Ion Microscope Studies of Radiation Damage

    • B. Ralph
    Pages 171-182

  13. Field-Ion Microscopy of Whiskers and thin Films and Applications (Real and Imagined) to Mass Spectrometry and Biological Molecule Imaging

    • Allan J. Melmed
    Pages 183-212

  14. Back Matter

    Pages 213-244
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Keywords

Editors and Affiliations

  • Department of Metallurgical and Materials Engineering, University of Florida, Gainesville, USA

    John J. Hren

  • Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley, USA

    S. Ranganathan

Bibliographic Information

  • Book Title: Field-Ion Microscopy

  • Editors: John J. Hren, S. Ranganathan

  • DOI: https://doi.org/10.1007/978-1-4899-6513-4

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1968

  • Softcover ISBN: 978-1-4899-6241-6Published: 01 January 1968

  • eBook ISBN: 978-1-4899-6513-4Published: 11 November 2013

  • Edition Number: 1

  • Number of Pages: XIV, 244

  • Number of Illustrations: 86 b/w illustrations

  • Topics: Characterization and Evaluation of Materials

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