Worked Examples in X-Ray Analysis

1. Front Matter

   Pages i-xi

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2. Spectra

   1. Characteristic spectra Moseley’s law

      • R. Jenkins, J. L. de Vries

      Pages 1-3

   2. Characteristic spectra — Prediction of possible transitions

      • R. Jenkins, J. L. de Vries

      Pages 4-5

   3. Continuous spectra — use of Kramers’ formula

      • R. Jenkins, J. L. de Vries

      Pages 6-8

   4. Continuous radiation — Scattered radiation

      • R. Jenkins, J. L. de Vries

      Pages 9-11

3. Instrumentation

   1. Detector resolution

      • R. Jenkins, J. L. de Vries

      Pages 12-13

   2. Dispersion as a function of ‘d’ spacing

      • R. Jenkins, J. L. de Vries

      Pages 14-15

   3. Choice of collimator/crystal combination

      • R. Jenkins, J. L. de Vries

      Pages 16-18

   4. Pulse height selection — crystal fluorescence

      • R. Jenkins, J. L. de Vries

      Pages 19-21

   5. Pulse height selection — pulse height variation

      • R. Jenkins, J. L. de Vries

      Pages 22-24

   6. Detectors — double plateaux

      • R. Jenkins, J. L. de Vries

      Pages 25-27

   7. Choice of detectors

      • R. Jenkins, J. L. de Vries

      Pages 28-29

   8. Count rate differences with Geiger and proportional counters

      • R. Jenkins, J. L. de Vries

      Pages 30-31

   9. Dispersion of the diffractometer

      • R. Jenkins, J. L. de Vries

      Pages 32-34

   10. Removal of sample fluorescence

       • R. Jenkins, J. L. de Vries

       Pages 35-39

   11. Spurious peaks in X-ray diffractograms

       • R. Jenkins, J. L. de Vries

       Pages 40-42

   12. Extra lines in X-ray diffractometry

       • R. Jenkins, J. L. de Vries

       Pages 43-45

4. Counting Statistics

   1. Counting statistics — variation of standard deviation with counting time

      • R. Jenkins, J. L. de Vries

      Pages 46-47

   2. Estimation of error introduced by ignoring the background

      • R. Jenkins, J. L. de Vries

      Pages 48-50

   3. Trace analysis — derivation of detection limit expression

      • R. Jenkins, J. L. de Vries

      Pages 51-53

The purpose of this book is to provide the reader with a series of work­ ed examples in X -ray spectrometry and X -ray diffractometry, in such a way that each example can be treated either as a posed question, i. e. one to which the reader must himself provide an answer, or as a guide to the method of treating a similar problem. The latter, of course, also pro­ vides a check on the answer produced by the reader. Although much basic theory can be derived by study of this work the first intention of the book is not to provide a source of basic theoretical knowledge in X -ray analy­ sis. It is hoped that the book will be utilized more as a guide line in the tackling of theoretical and practical problems and as a means of estab­ lishing whether or not the reader is able to work out for himself a certain type of problem. For example, the series of examples on counting statis­ tics has been chosen in such a way that after working through and under­ standing these, the reader should be able to handle most of the calculations that he is likely to come up against in this area.

• X-ray
• spectrometry

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