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Electron Probe Quantitation

  • Book
  • © 1991

Overview

Editors:
  1. K. F. J. Heinrich

    1. Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, USA

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  2. Dale E. Newbury

    1. Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, USA

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Table of contents (18 chapters)

  1. Front Matter

    Pages i-viii
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  2. Early Times of Electron Microprobe Analysis

    • R. Castaing
    Pages 1-7

  3. Strategies of Electron Probe Data Reduction

    • Kurt F. J. Heinrich
    Pages 9-18

  4. An Epma Correction Method Based upon a Quadrilateral ø(ρz) Profile

    • V. D. Scott, G. Love
    Pages 19-30

  5. Quantitative Analysis of Homogeneous or Stratified Microvolumes Applying the Model “PAP”

    • Jean-Louis Pouchou, Françoise Pichoir
    Pages 31-75

  6. φ(ρz) Equations for Quantitative Analysis

    • J. D. Brown
    Pages 77-81

  7. A Comprehensive Theory of Electron Probe Microanalysis

    • Rod Packwood
    Pages 83-104

  8. A Flexible and Complete Monte Carlo Procedure for the Study of the Choice of Parameters

    • J. Henoc, F. Maurice
    Pages 105-143

  9. Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen)

    • G. F. Bastin, H. J. M. Heijligers
    Pages 145-161

  10. Nonconductive Specimens in the Electron Probe Microanalyzer—A Hitherto Poorly Discussed Problem

    • G. F. Bastin, H. J. M. Heijligers
    Pages 163-175

  11. The R Factor: The X-Ray Loss Due to Electron Backscatter

    • R. L. Myklebust, D. E. Newbury
    Pages 177-190

  12. The Use of Tracer Experiments and Monte Carlo Calculations in the φ(ρz) Determination for Electron Probe Microanalysis

    • Peter Karduck, Werner Rehbach
    Pages 191-217

  13. Effect of Coster-Kronig Transitions on X-Ray Generation

    • János L. Lábár
    Pages 219-222

  14. Uncertainties in the Analysis of M X-Ray Lines of the Rare-Earth Elements

    • J. L. Lábár, C. J. Salter
    Pages 223-249

  15. Standards for Electron Probe Microanalysis

    • R. B. Marinenko
    Pages 251-260

  16. Quantitative Elemental Analysis of Individual Microparticles with Electron Beam Instruments

    • John T. Armstrong
    Pages 261-315

  17. The f(χ) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters

    • J. A. Small, D. E. Newbury, R. L. Myklebust, C. E. Fiori, A. A. Bell, K. F. J. Heinrich
    Pages 317-334

  18. Quantitative Compositional Mapping with the Electron Probe Microanalyzer

    • D. E. Newbury, R. B. Marinenko, R. L. Myklebust, D. S. Bright
    Pages 335-369

  19. Quantitative X-Ray Microanalysis in the Analytical Electron Microscope

    • D. B. Williams, J. I. Goldstein
    Pages 371-398

  20. Back Matter

    Pages 399-400
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Keywords

About this book

In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi­ cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.

Editors and Affiliations

  • Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, USA

    K. F. J. Heinrich, Dale E. Newbury

Bibliographic Information

  • Book Title: Electron Probe Quantitation

  • Editors: K. F. J. Heinrich, Dale E. Newbury

  • DOI: https://doi.org/10.1007/978-1-4899-2617-3

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1991

  • Hardcover ISBN: 978-0-306-43824-0Published: 30 June 1991

  • Softcover ISBN: 978-1-4899-2619-7Published: 30 May 2013

  • eBook ISBN: 978-1-4899-2617-3Published: 29 June 2013

  • Edition Number: 1

  • Number of Pages: VIII, 400

  • Topics: Biological Microscopy, Characterization and Evaluation of Materials

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