Skip to main content

Introduction to X-Ray Spectrometric Analysis

  • Book
  • © 1978

Overview

This is a preview of subscription content, log in via an institution to check access.

Access this book

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (11 chapters)

Keywords

About this book

X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif­ fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu­ facturers; the one- or two-week summer courses offered by a few uni­ versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin­ ner's level, this material is distributed throughout a mass of detail and more advanced material.

Authors and Affiliations

  • RCA Laboratories, David Sarnoff Research Center, Princeton, USA

    Eugene P. Bertin

Bibliographic Information

  • Book Title: Introduction to X-Ray Spectrometric Analysis

  • Authors: Eugene P. Bertin

  • DOI: https://doi.org/10.1007/978-1-4899-2204-5

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1978

  • Softcover ISBN: 978-0-306-31091-1Published: 01 March 1978

  • eBook ISBN: 978-1-4899-2204-5Published: 29 June 2013

  • Edition Number: 1

  • Number of Pages: XIV, 485

  • Number of Illustrations: 28 b/w illustrations

  • Topics: Analytical Chemistry

Publish with us