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Electron Energy-Loss Spectroscopy in the Electron Microscope

  • Book
  • © 1996

Overview

Authors:
  1. R. F. Egerton

    1. University of Alberta, Edmonton, Canada

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Table of contents (5 chapters)

  1. Front Matter

    Pages i-xi
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  2. An Introduction to Electron Energy-Loss Spectroscopy

    • R. F. Egerton
    Pages 1-29

  3. Instrumentation for Energy-Loss Spectroscopy

    • R. F. Egerton
    Pages 31-129

  4. Electron Scattering Theory

    • R. F. Egerton
    Pages 131-243

  5. Quantitative Analysis of the Energy-Loss Spectrum

    • R. F. Egerton
    Pages 245-299

  6. Applications of Energy-Loss Spectroscopy

    • R. F. Egerton
    Pages 301-402

  7. Back Matter

    Pages 403-485
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Keywords

About this book

to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec­ troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev­ eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re­ searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi­ cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Reviews

Reviews of the Second Edition:

`The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging.' -- JMSA

`Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference.' -- American Scientist

Authors and Affiliations

  • University of Alberta, Edmonton, Canada

    R. F. Egerton

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