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Table of contents (6 chapters)
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Front Matter
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Back Matter
About this book
Editors and Affiliations
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Engineering Institute of Geneva, Switzerland
Adam Osseiran
About the editor
Bibliographic Information
Book Title: Analog and Mixed-Signal Boundary-Scan
Book Subtitle: A Guide to the IEEE 1149.4 Test Standard
Editors: Adam Osseiran
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4757-4499-6
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1999
Hardcover ISBN: 978-0-7923-8686-5Published: 31 October 1999
Softcover ISBN: 978-1-4419-5115-1Published: 10 December 2010
eBook ISBN: 978-1-4757-4499-6Published: 09 March 2013
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XVIII, 156