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Electron Backscatter Diffraction in Materials Science

  • Book
  • © 2000

Overview

Editors:
  1. Adam J. Schwartz

    1. Lawrence Livermore National Laboratory, Livermore, USA

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    You can also search for this editor in PubMed   Google Scholar

  2. Mukul Kumar

    1. Lawrence Livermore National Laboratory, Livermore, USA

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    You can also search for this editor in PubMed   Google Scholar

  3. Brent L. Adams

    1. Brigham Young University, Provo, USA

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    You can also search for this editor in PubMed   Google Scholar

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Table of contents (25 chapters)

  1. Front Matter

    Pages i-xvi
    Download chapter PDF

  2. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy

    • David J. Dingley
    Pages 1-18

  3. Theoretical Framework for Electron Backscatter Diffraction

    • Valerie Randle
    Pages 19-30

  4. Representations of Texture in Orientation Space

    • Krishna Rajan
    Pages 31-38

  5. Rodrigues-Frank Representations of Crystallographic Texture

    • Krishna Rajan
    Pages 39-50

  6. Fundamentals of Automated EBSD

    • Stuart I. Wright
    Pages 51-64

  7. Studies on the Accuracy of Electron Backscatter Diffraction Measurements

    • Melik C. Demirel, Bassem S. El-Dasher, Brent L. Adams, Anthony D. Rollett
    Pages 65-74

  8. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope

    • Joseph R. Michael
    Pages 75-89

  9. Three-Dimensional Orientation Imaging

    • Dorte Juul Jensen
    Pages 91-104

  10. Automated Electron Backscatter Diffraction: Present State and Prospects

    • Robert A. Schwarzer
    Pages 105-122

  11. EBSD: Buying a System

    • Alwyn Eades
    Pages 123-126

  12. Hardware and Software Optimization for Orientation Mapping and Phase Identification

    • Patrick P. Camus
    Pages 127-134

  13. An Automated EBSD Acquisition and Processing System

    • Pierre Rolland, Keith G. Dicks
    Pages 135-140

  14. Advanced Software Capabilities for Automated EBSD

    • Stuart I. Wright, David P. Field, David J. Dingley
    Pages 141-152

  15. Strategies for Analyzing EBSD Datasets

    • Wayne E. King, James S. Stölken, Mukul Kumar, Adam J. Schwartz
    Pages 153-170

  16. Structure-Properties Relations: EBSD-Based Material-Sensitive Design

    • Brent L. Adams, Ben Henrie, Larry Howell, Richard Balling
    Pages 171-180

  17. Use of EBSD Data in Mesoscale Numerical Analyses

    • Richard Becker, Hasso Weiland
    Pages 181-198

  18. Characterization of Deformed Microstructures

    • David P. Field, Hasso Weiland
    Pages 199-212

  19. Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium

    • John F. Bingert, Thomas A. Mason, George C. Kaschner, Paul J. Maudlin, George T. Gray III
    Pages 213-229

  20. Measuring Strains Using Electron Backscatter Diffraction

    • Angus J. Wilkinson
    Pages 231-246
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Keywords

About this book

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIM™) and Automated Crystal Orientation Mapping (ACOM).

Editors and Affiliations

  • Lawrence Livermore National Laboratory, Livermore, USA

    Adam J. Schwartz, Mukul Kumar

  • Brigham Young University, Provo, USA

    Brent L. Adams

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