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Table of contents (14 chapters)
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Nondestructive Evaluation of Semiconductor Materials and Devices
Editors: Jay N. Zemel
Series Title: NATO Science Series B:
DOI: https://doi.org/10.1007/978-1-4757-1352-7
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1979
Softcover ISBN: 978-1-4757-1354-1Published: 11 September 2013
eBook ISBN: 978-1-4757-1352-7Published: 11 November 2013
Series ISSN: 0258-1221
Edition Number: 1
Number of Pages: XI, 782
Topics: Electrical Engineering