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Table of contents (25 chapters)
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Front Matter
About this book
Editors and Affiliations
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Department of Physics, Durham University, Durham, UK
Brian K. Tanner
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Department of Engineering, Warwick University, Coventry, UK
D. Keith Bowen
Bibliographic Information
Book Title: Characterization of Crystal Growth Defects by X-Ray Methods
Editors: Brian K. Tanner, D. Keith Bowen
Series Title: NATO Science Series B:
DOI: https://doi.org/10.1007/978-1-4757-1126-4
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1980
Softcover ISBN: 978-1-4757-1128-8Published: 16 December 2012
eBook ISBN: 978-1-4757-1126-4Published: 17 April 2013
Series ISSN: 0258-1221
Edition Number: 1
Number of Pages: XXVI, 589
Number of Illustrations: 556 b/w illustrations