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Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

  • Book
  • © 1988

Overview

Editors:
  1. P. K. Larsen

    1. Philips Research Laboratories, Eindhoven, The Netherlands

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    You can also search for this editor in PubMed   Google Scholar

  2. P. J. Dobson

    1. Philips Research Laboratories, Redhill, UK

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series B: (NSSB, volume 188)

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Table of contents (37 chapters)

  1. Front Matter

    Pages i-xiii
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  2. Surface Structural Determination

    1. Front Matter

      Pages 1-1
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    3. Theory

      1. Surface Structural Determination Using RHEED
        • J. L. Beeby
        Pages 29-42
      2. Theory of RHEED by Reconstructed Surfaces
        • M. G. Knibb, P. A. Maksym
        Pages 43-62
      3. Accurate Dynamical Theory for RHEED Rocking-Curve Intensity Spectra
        • S. Y. Tong, T. C. Zhao, H. C. Poon
        Pages 63-75

    4. Inelastic Effects

      1. Inelastic Scattering Effects in RHEED and Reflection Imaging
        • A. L. Bleloch, A. Howie, R. H. Milne, M. G. Walls
        Pages 77-89
      2. Excitation of Dielectric Spheres by Electron Beams
        • P. M. Echenique
        Pages 91-95

  4. Disorders and Steps in Electron Diffraction

    1. Front Matter

      Pages 137-137
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    2. Diffraction from Disordered Surfaces: An Overview

      • M. G. Lagally, D. E. Savage, M. C. Tringides
      Pages 139-174

    3. Theory of Electron Scattering from Defect: Steps on Surfaces with Non-Equivalent Terraces

      • W. Moritz
      Pages 175-191

    4. Diffraction from Stepped Surfaces

      • M. Henzler
      Pages 193-199

    5. RHEED and Disordered Surfaces

      • B. Bölger, P. K. Larsen, G. Meyer Ehmsen
      Pages 201-209

    6. Temperature Diffuse Scattering in RHEED

      • M. Albrecht, G. Meyer-Ehmsen
      Pages 211-216

    7. Temperature Dependence of the Surface Disorder on Ge(001) Due to Ar+ Ion Bombardment

      • A. J. Hoeven, J. S. C. Kools, J. Aarts, P. C. Zalm
      Pages 217-224
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Keywords

About this book

This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.

Editors and Affiliations

  • Philips Research Laboratories, Eindhoven, The Netherlands

    P. K. Larsen

  • Philips Research Laboratories, Redhill, UK

    P. J. Dobson

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