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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.
This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Authors and Affiliations
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State University of New York at Buffalo, USA
Sreejit Chakravarty
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Intel Corporation, USA
Paul J. Thadikaran
Bibliographic Information
Book Title: Introduction to IDDQ Testing
Authors: Sreejit Chakravarty, Paul J. Thadikaran
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4615-6137-8
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1997
Hardcover ISBN: 978-0-7923-9945-2Published: 30 June 1997
Softcover ISBN: 978-1-4613-7812-9Published: 12 October 2012
eBook ISBN: 978-1-4615-6137-8Published: 06 December 2012
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XIX, 323
Topics: Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design