Authors:
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 425)
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (8 chapters)
-
Front Matter
-
Back Matter
About this book
Authors and Affiliations
-
Bell Laboratories, USA
Alper Demir
-
University of California, USA
Alberto Sangiovanni-Vincentelli
Bibliographic Information
Book Title: Analysis and Simulation of Noise in Nonlinear Electronic Circuits and Systems
Authors: Alper Demir, Alberto Sangiovanni-Vincentelli
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4615-6063-0
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1998
Hardcover ISBN: 978-0-7923-8037-5Published: 30 November 1997
Softcover ISBN: 978-1-4613-7777-1Published: 02 November 2012
eBook ISBN: 978-1-4615-6063-0Published: 06 December 2012
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: IX, 275
Topics: Circuits and Systems, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design