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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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University of California, Santa Barbara, USA
Angela Krstić, Kwang-Ting Cheng
Bibliographic Information
Book Title: Delay Fault Testing for VLSI Circuits
Authors: Angela Krstić, Kwang-Ting Cheng
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4615-5597-1
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1998
Hardcover ISBN: 978-0-7923-8295-9Published: 31 October 1998
Softcover ISBN: 978-1-4613-7561-6Published: 12 October 2012
eBook ISBN: 978-1-4615-5597-1Published: 06 December 2012
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XII, 191
Topics: Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design