Neural Models and Algorithms for Digital Testing

1. Front Matter

   Pages i-xiii

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2. Introduction

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 1-7

3. Logic Circuits and Testing

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 9-19

4. Parallel Processing Preliminaries

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 21-25

5. Introduction to Neural Networks

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 27-32

6. Neural Modeling for Digital Circuits

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 33-50

7. Test Generation Reformulated

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 51-55

8. Simulated Neural Networks

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 57-69

9. Neural Computers

   • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

   Pages 71-83

10. Quadratic 0-1 Programming

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 85-102

11. Transitive Closure And Testing

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 103-121

12. Polynomial-time Testability

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 123-139

13. Special Cases of Hard Problems

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 141-161

14. Solving Graph Problems

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 163-174

15. Open Problems

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 175-177

16. Conclusion

    • Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil

    Pages 179-180

17. Back Matter

    Pages 181-184

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References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identification 117 10. 6 Summary 119 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 11 POLYNOMIAL-TIME TESTABILITY 123 11. 1 Background 124 11. 1. 1 Fujiwara's Result 125 11. 1. 2 Contribution of the Present Work . . . . . . . . . 126 11. 2 Notation and Tenninology 127 11. 3 A Polynomial TlDle Algorithm 128 11. 3. 1 Primary Output Fault 129 11. 3. 2 Arbitrary Single Fault 135 11. 3. 3 Multiple Faults. . . . . . . . . . . . . . . . . . . 137 11. 4 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 139 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 ix 12 SPECIAL CASES OF HARD PROBLEMS 141 12. 1 Problem Statement 142 12. 2 Logic Simulation 143 12. 3 Logic Circuit Modeling . 146 12. 3. 1 Modelfor a Boolean Gate . . . . . . . . . . . . . 147 12. 3. 2 Circuit Modeling 148 12.

• algorithms
• circuit
• complexity
• computer
• integrated circuit
• logic
• model
• modeling
• network
• networks
• neural networks
• organization
• programming
• simulation
• stability

• NEC Research Institute, USA

  Srimat T. Chakradhar

• AT&T Bell Laboratories, USA

  Vishwani D. Agrawal

• Rutgers University, USA

  Michael L. Bushneil

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