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Ion Spectroscopies for Surface Analysis

  • Book
  • © 1991

Overview

Editors:
  1. A. W. Czanderna

    1. Solar Energy Research Institute, Golden, USA

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    You can also search for this editor in PubMed   Google Scholar

  2. David M. Hercules

    1. University of Pittsburgh, Pittsburgh, USA

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Methods of Surface Characterization (MOSC, volume 2)

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xvii
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  2. Overview of Ion Spectroscopies for Surface Compositional Analysis

    • A. W. Czanderna
    Pages 1-44

  3. Surface Structure and Reaction Studies by Ion-Solid Collisions

    • Nicholas Winograd, Barbara J. Garrison
    Pages 45-141

  4. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry

    • Kenneth L. Busch
    Pages 143-271

  5. Laser Resonant and Nonresonant Photoionization of Sputtered Neutrals

    • Christopher H. Becker
    Pages 273-310

  6. Rutherford Backscattering and Nuclear Reaction Analysis

    • L. C. Feldman
    Pages 311-361

  7. Ion Scattering Spectroscopy

    • E. Taglauer
    Pages 363-416

  8. Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS Methods for Surface Compositional Analysis

    • C. J. Powell, D. M. Hercules, A. W. Czanderna
    Pages 417-437

  9. Back Matter

    Pages 439-469
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Keywords

About this book

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap­ proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita­ tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.

Editors and Affiliations

  • Solar Energy Research Institute, Golden, USA

    A. W. Czanderna

  • University of Pittsburgh, Pittsburgh, USA

    David M. Hercules

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