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Testability Concepts for Digital ICs

The Macro Test Approach

  • Book
  • © 1995

Overview

Authors:
  1. F. P. M. Beenker

    1. Philips Medical Systems, The Netherlands

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  2. R. G. Bennetts

    1. Synopsys, Inc., USA

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    You can also search for this author in PubMed   Google Scholar

  3. A. P. Thijssen

    1. TU Delft, The Netherlands

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Part of the book series: Frontiers in Electronic Testing (FRET, volume 3)

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-ix
    Download chapter PDF

  2. Introduction

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 1-8

  3. Defect-Oriented Testing

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 9-17

  4. Macro Test: A Framework for Testable IC Design

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 19-40

  5. Examples of Leaf-Macro Test Techniques

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 41-79

  6. Scan Chain Routing with Minimal Test Application Time

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 81-105

  7. Test Control Block Concepts

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 107-138

  8. Exploiting Parallelism in Leaf-Macro Access

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 139-169

  9. Timing Aspects of CMOS VLSI Circuits

    • F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 171-191

  10. Back Matter

    Pages 193-212
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Keywords

About this book

Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long­ term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.

Authors and Affiliations

  • Philips Medical Systems, The Netherlands

    F. P. M. Beenker

  • Synopsys, Inc., USA

    R. G. Bennetts

  • TU Delft, The Netherlands

    A. P. Thijssen

Bibliographic Information

  • Book Title: Testability Concepts for Digital ICs

  • Book Subtitle: The Macro Test Approach

  • Authors: F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen

  • Series Title: Frontiers in Electronic Testing

  • DOI: https://doi.org/10.1007/978-1-4615-2365-9

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media Dordrecht 1995

  • Hardcover ISBN: 978-0-7923-9658-1Published: 30 November 1995

  • Softcover ISBN: 978-1-4613-6004-9Published: 04 October 2012

  • eBook ISBN: 978-1-4615-2365-9Published: 06 December 2012

  • Series ISSN: 0929-1296

  • Edition Number: 1

  • Number of Pages: IX, 212

  • Topics: Circuits and Systems, Electrical Engineering

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