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Table of contents (18 chapters)
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Front Matter
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Back Matter
About this book
Reviews
from the Foreword by Peter Duncumb, University of Cambridge, England
`Contains a vast amount of detailed information and will surely be heavily used.'
Ultramicroscopy
Editors and Affiliations
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Lehigh University, Bethlehem, USA
David B. Williams
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University of Massachusetts at Amherst, Amherst, USA
Joseph I. Goldstein
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National Institute of Standards and Technology, Gaithersburg, USA
Dale E. Newbury
Bibliographic Information
Book Title: X-Ray Spectrometry in Electron Beam Instruments
Editors: David B. Williams, Joseph I. Goldstein, Dale E. Newbury
DOI: https://doi.org/10.1007/978-1-4615-1825-9
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Plenum Press, New York 1995
Hardcover ISBN: 978-0-306-44858-4Published: 31 March 1995
Softcover ISBN: 978-1-4613-5738-4Published: 21 October 2012
eBook ISBN: 978-1-4615-1825-9Published: 06 December 2012
Edition Number: 1
Number of Pages: XVIII, 372
Topics: Biological Microscopy, Analytical Chemistry, Characterization and Evaluation of Materials