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Advances in X-Ray Analysis

Volume 15

  • Book
  • © 1972

Overview

Editors:
  1. Kurt F. J. Heinrich

    1. National Bureau of Standards, USA

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  2. Charles S. Barrett

    1. Denver Research Institute, The University of Denver, Denver, USA

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  3. John B. Newkirk

    1. Denver Research Institute, The University of Denver, Denver, USA

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  4. Clayton O. Ruud

    1. Denver Research Institute, The University of Denver, Denver, USA

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Table of contents (45 chapters)

  1. Front Matter

    Pages i-xii
    Download chapter PDF

  2. The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry — A Review

    • R. L. Heath
    Pages 1-35

  3. Detection of Single Ions by Pulse Counting: Application to Ion Microprobe Mass Analyzer

    • L. A. Dietz
    Pages 36-55

  4. Application of Computers in Electron Probe and X-Ray Fluorescence Analysis

    • Stanley D. Rasberry
    Pages 56-69

  5. Computer-Controlled X-Ray and Neutron Diffraction Experiments

    • Melvin H. Mueller
    Pages 70-89

  6. An Automated Two-Crystal Spectrometer Employing Direct Angular Positioning and Readout

    • T. K. Gregory, P. E. Best
    Pages 90-101

  7. A Paper Tape Controlled X-Ray Diffractometer for the Measurement of Retained Austenite

    • Carol J. Kelly, M. A. Short
    Pages 102-113

  8. Automated X-Ray Diffraction Laboratory System

    • Armin Segmüller
    Pages 114-122

  9. X-Ray Diffraction Topography-Differential Omega Scanning Technique

    • Ray L. Silver, Jack C. Turner
    Pages 123-134

  10. A Modular Automatic X-Ray Analysis System

    • M. Slaughter, Davis Carpenter
    Pages 135-147

  11. An Automated Electron Microprobe System

    • F. Kunz, E. Eichen, H. Matthews, J. Francis
    Pages 148-163

  12. Rapid Quantitative Analysis by X-Ray Spectrometry

    • Robert D. Giauque, Joseph M. Jaklevic
    Pages 164-175

  13. On the Method of Variable Take-Off Angle for Quantitative X-Ray Fluorescence Analysis (XRFA)

    • H. Ebel, M. F. Ebel
    Pages 176-184

  14. An Automatic X-Ray Analytical Instrument for the Chemical Laboratory

    • A. L. Gray
    Pages 185-196

  15. Energy Dispersive Analysis for Adjacent Elements Using Two Single Channel Analyzers

    • Hubert K. Chow
    Pages 197-208

  16. Determination of Zirconium, Hafnium, Niobium, Tantalum, Molybdenum and Tungsten in Aqueous Solutions by Radioisotopic Excited X-Ray Fluorescence

    • Frank L. Chan, W. Barclay Jones
    Pages 209-227

  17. Fluorescence Analysis Using an Si (Li) X-Ray Energy Analysis System with Low-Power X-Ray Tubes and Radioisotopes

    • G. R. Dyer, D. A. Gedcke, T. R. Harris
    Pages 228-239

  18. Rapid Recording of Powder Diffraction Patterns with Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis

    • Cullie J. Sparks Jr.
    Pages 240-253

  19. A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis

    • G. W. Martin, A. S. Klein
    Pages 254-265

  20. Small X-Ray Tubes for Energy Dispersive Analysis Using Semiconductor Spectrometers

    • J. M. Jaklevic, R. D. Giauque, D. F. Malone, W. L. Searles
    Pages 266-275
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Keywords

About this book

The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu­ ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac­ teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

Editors and Affiliations

  • National Bureau of Standards, USA

    Kurt F. J. Heinrich

  • Denver Research Institute, The University of Denver, Denver, USA

    Charles S. Barrett, John B. Newkirk, Clayton O. Ruud

Bibliographic Information

  • Book Title: Advances in X-Ray Analysis

  • Book Subtitle: Volume 15

  • Editors: Kurt F. J. Heinrich, Charles S. Barrett, John B. Newkirk, Clayton O. Ruud

  • DOI: https://doi.org/10.1007/978-1-4613-9966-7

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: University of Denver 1972

  • Softcover ISBN: 978-1-4613-9968-1Published: 12 June 2012

  • eBook ISBN: 978-1-4613-9966-7Published: 29 June 2013

  • Edition Number: 1

  • Number of Pages: XII, 574

  • Number of Illustrations: 225 b/w illustrations

  • Topics: Physical Chemistry

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