Advances in X-Ray Analysis

1. Front Matter

   Pages i-xii

   PDF

2. The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry — A Review

   • R. L. Heath

   Pages 1-35

3. Detection of Single Ions by Pulse Counting: Application to Ion Microprobe Mass Analyzer

   • L. A. Dietz

   Pages 36-55

4. Application of Computers in Electron Probe and X-Ray Fluorescence Analysis

   • Stanley D. Rasberry

   Pages 56-69

5. Computer-Controlled X-Ray and Neutron Diffraction Experiments

   • Melvin H. Mueller

   Pages 70-89

6. An Automated Two-Crystal Spectrometer Employing Direct Angular Positioning and Readout

   • T. K. Gregory, P. E. Best

   Pages 90-101

7. A Paper Tape Controlled X-Ray Diffractometer for the Measurement of Retained Austenite

   • Carol J. Kelly, M. A. Short

   Pages 102-113

8. Automated X-Ray Diffraction Laboratory System

   • Armin Segmüller

   Pages 114-122

9. X-Ray Diffraction Topography-Differential Omega Scanning Technique

   • Ray L. Silver, Jack C. Turner

   Pages 123-134

10. A Modular Automatic X-Ray Analysis System

    • M. Slaughter, Davis Carpenter

    Pages 135-147

11. An Automated Electron Microprobe System

    • F. Kunz, E. Eichen, H. Matthews, J. Francis

    Pages 148-163

12. Rapid Quantitative Analysis by X-Ray Spectrometry

    • Robert D. Giauque, Joseph M. Jaklevic

    Pages 164-175

13. On the Method of Variable Take-Off Angle for Quantitative X-Ray Fluorescence Analysis (XRFA)

    • H. Ebel, M. F. Ebel

    Pages 176-184

14. An Automatic X-Ray Analytical Instrument for the Chemical Laboratory

    • A. L. Gray

    Pages 185-196

15. Energy Dispersive Analysis for Adjacent Elements Using Two Single Channel Analyzers

    • Hubert K. Chow

    Pages 197-208

16. Determination of Zirconium, Hafnium, Niobium, Tantalum, Molybdenum and Tungsten in Aqueous Solutions by Radioisotopic Excited X-Ray Fluorescence

    • Frank L. Chan, W. Barclay Jones

    Pages 209-227

17. Fluorescence Analysis Using an Si (Li) X-Ray Energy Analysis System with Low-Power X-Ray Tubes and Radioisotopes

    • G. R. Dyer, D. A. Gedcke, T. R. Harris

    Pages 228-239

18. Rapid Recording of Powder Diffraction Patterns with Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis

    • Cullie J. Sparks Jr.

    Pages 240-253

19. A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis

    • G. W. Martin, A. S. Klein

    Pages 254-265

20. Small X-Ray Tubes for Energy Dispersive Analysis Using Semiconductor Spectrometers

    • J. M. Jaklevic, R. D. Giauque, D. F. Malone, W. L. Searles

    Pages 266-275

The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu­ ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac­ teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

• Migration
• Silicat
• X-ray
• Zirconium
• analytical chemistry
• crystal
• diffraction
• electron
• fluorescence
• fluorescence spectroscopy
• isotope
• lattice parameter
• quantitative analysis
• spectrometry
• spectroscopy

• National Bureau of Standards, USA

  Kurt F. J. Heinrich

• Denver Research Institute, The University of Denver, Denver, USA

  Charles S. Barrett, John B. Newkirk, Clayton O. Ruud

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