Quantitative X-Ray Diffractometry

1. Front Matter

   Pages i-xvii

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2. Introduction

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 1-9

3. Physical basis

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 10-50

4. Geometric aspects of X-ray diffractometry

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 51-99

5. Methodology of quantitative phase analysis

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 100-225

6. Practical aspects of quantitative phase analysis

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 226-336

7. Industrial applications

   • Lev S. Zevin, Giora Kimmel, Inez Mureinik

   Pages 337-354

8. Back Matter

   Pages 355-372

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One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.

• Powder diffraction
• crystal
• polymer
• scattering
• thin films

• The Institutes for Applied Research, Ben-Gurion University of the Negev, Beer-Sheva, Israel

  Inez Mureinik

• The Institutes for Applied Research and Department of Materials Engineering, Ben-Gurion University of the Negev, Beer-Sheva, Israel

  Lev S. Zevin

• Department of Materials Engineering, Ben-Gurion University of the Negev, Beer-Sheva, Israel

  Giora Kimmel

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