Overview
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 169)
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Table of contents (12 chapters)
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Phase-Based Velocity Measurement
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On Phase Properties of Band-Pass Signals
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Conclusions
Keywords
About this book
The formulation of the problem emphasizes the geometric and photometric properties of image formation, and the occurrence of multiple image velocities caused, for example, by specular reflections, shadows, or transparency. The method proposed for measuring image velocity is based on the phase behavior in the output of velocity-tuned filters. Extensive experimental work is used to show that phase can be a reliable source of pure image translation, small geometric deformation, smooth contrast variations, and multiple local velocities. Extensive theorectical analysis is used to explain the robustness of phase with respect to deviations from image translation, and to detect situations in which phase becomes unstable. The results indicate that optical flow may be extracted reliably for computing egomotion and structure from motion.
The monograph also contains a review of other techniques and frequency analysis applied to image sequences, and it discusses the closely related topics of zero-crossing tracking, gradient-based methods, and the measurement of binocular disparity. The work is relevant to those studying machine vision and visual perception.
Authors and Affiliations
Bibliographic Information
Book Title: Measurement of Image Velocity
Authors: David J. Fleet
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4615-3648-2
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1992
Hardcover ISBN: 978-0-7923-9198-2Published: 31 March 1992
Softcover ISBN: 978-1-4613-6623-2Published: 30 September 2012
eBook ISBN: 978-1-4615-3648-2Published: 06 December 2012
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XIII, 203
Topics: Computer Imaging, Vision, Pattern Recognition and Graphics, Artificial Intelligence, Control, Robotics, Mechatronics