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Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 19)
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Table of contents (5 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Stanford University, USA
Narinder Singh
Bibliographic Information
Book Title: An Artificial Intelligence Approach to Test Generation
Authors: Narinder Singh
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4613-1979-5
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Kluwer Academic Publishers 1987
Hardcover ISBN: 978-0-89838-185-6Published: 28 February 1987
Softcover ISBN: 978-1-4612-9183-1Published: 05 October 2011
eBook ISBN: 978-1-4613-1979-5Published: 06 December 2012
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XIV, 194
Topics: Circuits and Systems, Artificial Intelligence, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design