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Table of contents (31 chapters)
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Introduction to Metallization and Metal-Semiconductor Interfaces
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General Schottky Barrier Mechanisms
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Defects at Metal-Semiconductor Contacts
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Temperature Dependent Metallization Studies
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Silicon-Silicide Interfaces
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Metallization and Metal-Semiconductor Interfaces
Editors: Inder P. Batra
Series Title: NATO Science Series B:
DOI: https://doi.org/10.1007/978-1-4613-0795-2
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Plenum Press, New York 1989
Softcover ISBN: 978-1-4612-8086-6Published: 23 November 2011
eBook ISBN: 978-1-4613-0795-2Published: 06 December 2012
Series ISSN: 0258-1221
Edition Number: 1
Number of Pages: 522
Topics: Solid State Physics, Spectroscopy and Microscopy, Condensed Matter Physics, Crystallography and Scattering Methods, Characterization and Evaluation of Materials