Life-Cycle Assessment of Semiconductors

1. Front Matter

   Pages i-xxvii

   PDF

2. Introduction

   • Sarah B. Boyd

   Pages 1-12

3. Semiconductor LCI Methods

   • Sarah B. Boyd

   Pages 13-26

4. Semiconductor Manufacturing Trends in Product Type and Geography

   • Sarah B. Boyd

   Pages 27-35

5. Life-Cycle Energy and Global Warming Emissions of CMOS Logic

   • Sarah B. Boyd

   Pages 37-68

6. Life-Cycle Assessment of CMOS Logic

   • Sarah B. Boyd

   Pages 69-86

7. Life-Cycle Assessment of Flash Memory

   • Sarah B. Boyd

   Pages 87-96

8. Life-Cycle Assessment of Dynamic Random Access Memory

   • Sarah B. Boyd

   Pages 97-107

9. Semiconductor LCA: The Road Ahead

   • Sarah B. Boyd

   Pages 109-112

10. Back Matter

    Pages 113-226

    PDF

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

• CMOS
• Flash Memory
• Life Cycle Assessment
• Random Access Memory
• Semiconductor Manufacturing

• Pe Americas, LLC, Boston, USA

  Sarah B. Boyd

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