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  • © 2011

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Authors:

  • Nominated as an outstanding contribution by the University of Illinois – Chicago
  • Offers fundamental results which influence many high temperature and pressure applications
  • Provides findings to offer increased control over the performance of ceramic and semiconductor materials
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Theses (Springer Theses)

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-xiii
  2. Silicon Nitride Ceramics

    • Weronika Walkosz
    Pages 1-10
  3. Theoretical Methods and Approximations

    • Weronika Walkosz
    Pages 11-21
  4. Overview of Experimental Tools

    • Weronika Walkosz
    Pages 23-43
  5. Imaging Bulk α-Si3N4

    • Weronika Walkosz
    Pages 91-96
  6. Conclusions and Future Work

    • Weronika Walkosz
    Pages 97-100
  7. Back Matter

    Pages 101-108

About this book

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline βSi3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).  These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications.  The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before.  The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

Authors and Affiliations

  • Argonne, USA

    Weronika Walkosz

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access