Editors:
- Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics
- Includes supplementary material: sn.pub/extras
Part of the book series: Frontiers in Electronic Testing (FRET, volume 41)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.
The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Editors and Affiliations
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Grenoble INP, CNRS, UJF, TIMA Laboratory, Grenoble CX, France
Michael Nicolaidis
Bibliographic Information
Book Title: Soft Errors in Modern Electronic Systems
Editors: Michael Nicolaidis
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4419-6993-4
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s) 2011
Hardcover ISBN: 978-1-4419-6992-7Published: 30 September 2010
Softcover ISBN: 978-1-4614-2689-9Published: 05 November 2012
eBook ISBN: 978-1-4419-6993-4Published: 24 September 2010
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XVIII, 318
Topics: Circuits and Systems, System Performance and Evaluation, Performance and Reliability, Electrical Engineering