Authors:
- Provides a set of valuable techniques to design dependability into embedded systems;
- Describes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications;
- Discusses vulnerability in power supply systems and how power integration is accomplished.
- Includes supplementary material: sn.pub/extras
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Table of contents (6 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Hitachi Research Laboratory, Hitachi, Ltd., Hitachi-shi, Ibaraki, Japan
Nobuyasu Kanekawa
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Hitachi Research Laboratory, Hitachi, Ltd., Yokohama-shi, Kanagawa, Japan
Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
Bibliographic Information
Book Title: Dependability in Electronic Systems
Book Subtitle: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Authors: Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
DOI: https://doi.org/10.1007/978-1-4419-6715-2
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2011
Hardcover ISBN: 978-1-4419-6714-5
Softcover ISBN: 978-1-4899-8594-1
eBook ISBN: 978-1-4419-6715-2
Edition Number: 1
Number of Pages: XXV, 204
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design