Process Variations and Probabilistic Integrated Circuit Design

1. Front Matter

   Pages i-xvi

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2. Introduction

   • Joachim Haase, Manfred Dietrich

   Pages 1-10

3. Physical and Mathematical Fundamentals

   • Bernd Lemaitre, Christoph Sohrmann, Lutz Muche, Joachim Haase

   Pages 11-67

4. Examination of Process Parameter Variations

   • Emrah Acar, Hendrik Mau, Andy Heinig, Bing Li, Ulf Schlichtmann

   Pages 69-89

5. Methods of Parameter Variations

   • Christoph Knoth, Ulf Schlichtmann, Bing Li, Min Zhang, Markus Olbrich, Emrah Acar et al.

   Pages 91-179

6. Consequences for Circuit Design and Case Studies

   • Alyssa C. Bonnoit, Reimund Wittmann

   Pages 181-213

7. Conclusion

   • Manfred Dietrich

   Pages 215-222

8. Back Matter

   Pages 223-249

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Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

• Circuit Design
• DFM
• Design for Manufacturing
• Embedded Systems
• Probabilistic integrated circuit design
• Process Variation

• Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Dresden, Germany

  Manfred Dietrich, Joachim Haase

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