Overview
- Authors:
-
-
Vladislav A. Vashchenko
-
National Semiconductor, Santa Clara, USA
-
Andrei Shibkov
-
Angstrom Design Automation, Inc., San Jose, USA
- Includes case studies that involve four classes of baseline ESD devices
- Features based software simulation with topics that overlap the text material
- Provides many device level solutions
- Includes supplementary material: sn.pub/extras
Access this book
Other ways to access
Table of contents (8 chapters)
-
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 1-14
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 15-68
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 69-154
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 155-212
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 213-279
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 282-315
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 317-393
-
- Vladislav A. Vashchenko, Andrei Shibkov
Pages 395-444
-
Back Matter
Pages 447-459
About this book
This Book and Simulation Software Bundle Project Dear Reader, this book project brings to you a unique study tool for ESD protection solutions used in analog-integrated circuit (IC) design. Quick-start learning is combined with in-depth understanding for the whole spectrum of cro- disciplinary knowledge required to excel in the ESD ?eld. The chapters cover technical material from elementary semiconductor structure and device levels up to complex analog circuit design examples and case studies. The book project provides two different options for learning the material. The printed material can be studied as any regular technical textbook. At the same time, another option adds parallel exercise using the trial version of a complementary commercial simulation tool with prepared simulation examples. Combination of the textbook material with numerical simulation experience presents a unique opportunity to gain a level of expertise that is hard to achieve otherwise. The book is bundled with simpli?ed trial version of commercial mixed- TM mode simulation software from Angstrom Design Automation. The DECIMM (Device Circuit Mixed-Mode) simulator tool and complementary to the book s- ulation examples can be downloaded from www.analogesd.com. The simulation examples prepared by the authors support the speci?c examples discussed across the book chapters. A key idea behind this project is to provide an opportunity to not only study the book material but also gain a much deeper understanding of the subject by direct experience through practical simulation examples.
Authors and Affiliations
-
National Semiconductor, Santa Clara, USA
Vladislav A. Vashchenko
-
Angstrom Design Automation, Inc., San Jose, USA
Andrei Shibkov
About the authors
Dr. Vladislav Vashchenko received MS, Engineer-Physicist (1986) followed by “Ph.D. in Physics of Semiconductors” (1990) from Moscow Institute of Physics and Technology for the study of self-organization phenomena in semiconductor structures under breakdown. Since 1984 he was working in reliability department of State Research Institute “Pulsar” (Moscow) occupying positions from the student intern to head of laboratory. In 1997 he was awarded the “Doctor of Science in Microelectronics” degree for the cycle of studies and new solutions of the reliability problems in power GaAs MESFET’s, microwave silicon devices and the developed test methods. In the period 1995-1997 he managed the work on contracts for high reliability components for Russian Space Agency, commercial and military customers. In 2000 he joined Advanced Process Development Group in National Semiconductor Corp. to work on design of the ESD protection solutions for analog products. Currently he is leader and manager of R&D group responsible for ESD development for new processes and products. His current research interests are mainly focused on the power devices, device level reliability, ESD solutions, physical process and device simulation for ESD. His studies are widely presented in major device research forums. He author of 108 U.S. patents and over 80 research and review papers in the fields of reliability and ESD.
