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Advanced Computing in Electron Microscopy

  • Book
  • © 2010

Overview

Authors:
  1. Earl J. Kirkland

    1. School of Applied and Engineering Physic, Cornell University, Ithaca, USA

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  • This book features numerical computation of electron microscopy images as well as multislice methods
  • High resolution CTEM and STEM image interpretation are included in the text
  • This newly updated second edition will bring the reader up to date on new developments in the field since the 1990's
  • The only book that specifically addresses computer simulation methods in electron microscopy

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Table of contents (13 chapters)

  1. Front Matter

    Pages i-x
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  2. Introduction

    • Earl J. Kirkland
    Pages 1-4

  3. The Transmission Electron Microscope

    • Earl J. Kirkland
    Pages 5-27

  4. Linear Image Approximations

    • Earl J. Kirkland
    Pages 29-60

  5. Sampling and the Fast Fourier Transform

    • Earl J. Kirkland
    Pages 61-76

  6. Calculation of Images of Thin Specimens

    • Earl J. Kirkland
    Pages 77-113

  7. Theory of Calculation of Images of Thick Specimens

    • Earl J. Kirkland
    Pages 115-161

  8. Multislice Applications and Examples

    • Earl J. Kirkland
    Pages 163-197

  9. The Programs

    • Earl J. Kirkland
    Pages 199-231

  10. Plotting Transfer Functions

    • Earl J. Kirkland
    Pages 233-240

  11. The Fourier Projection Theorem

    • Earl J. Kirkland
    Pages 241-242

  12. Atomic Potentials and Scattering Factors

    • Earl J. Kirkland
    Pages 243-260

  13. Bilinear Interpolation

    • Earl J. Kirkland
    Pages 261-263

  14. 3D Perspective View

    • Earl J. Kirkland
    Pages 265-269

  15. Back Matter

    Pages 287-289
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Keywords

About this book

Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/˜kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Reviews

From the reviews of the second edition:

“It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)

Authors and Affiliations

  • School of Applied and Engineering Physic, Cornell University, Ithaca, USA

    Earl J. Kirkland

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