Authors:
- Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books
- Comprehensive scope and solutions: from RTL to post-silicon debugging
- The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources
- First empirical comparison of several methods for spare-cell insertion
- A variety of examples and figures to illustrate key concepts and algorithms
Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 32)
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Table of contents (13 chapters)
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Front Matter
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Background and Prior Art
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Front Matter
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FogClear Methodologies and Theoretical Advances in Error Repair
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Front Matter
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Back Matter
About this book
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Authors and Affiliations
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Dept. Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, USA
Kai-hui Chang, Igor L. Markov, Valeria Bertacco
About the authors
Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors
Bibliographic Information
Book Title: Functional Design Errors in Digital Circuits
Book Subtitle: Diagnosis Correction and Repair
Authors: Kai-hui Chang, Igor L. Markov, Valeria Bertacco
Series Title: Lecture Notes in Electrical Engineering
DOI: https://doi.org/10.1007/978-1-4020-9365-4
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2009
Hardcover ISBN: 978-1-4020-9364-7Published: 10 December 2008
Softcover ISBN: 978-90-481-8112-4Published: 28 October 2010
eBook ISBN: 978-1-4020-9365-4Published: 02 December 2008
Series ISSN: 1876-1100
Series E-ISSN: 1876-1119
Edition Number: 1
Number of Pages: XXIV, 200
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design, Logic Design