Authors:
- Strategies for design-oriented ESD protection
- Distributed ESD protection networks optimized for sub-90nm CMOS ICs
- ESD protection strategies for smart power ICs used in automotive industry
- The impact of burn-in testing (accelerated test methods) on the ESD robustness
- The charge board ESD (CBM) testing used for wireless products
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Table of contents (9 chapters)
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Front Matter
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Back Matter
About this book
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.
Authors and Affiliations
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University of Waterloo, Waterloo, Canada
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
Bibliographic Information
Book Title: ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Authors: Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
DOI: https://doi.org/10.1007/978-1-4020-8301-3
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2008
Hardcover ISBN: 978-1-4020-8300-6Published: 06 May 2008
Softcover ISBN: 978-90-481-7836-0Published: 19 October 2010
eBook ISBN: 978-1-4020-8301-3Published: 26 April 2008
Edition Number: 1
Number of Pages: XVIII, 228
Topics: Electronics and Microelectronics, Instrumentation, Circuits and Systems, Optical and Electronic Materials, Solid State Physics, Spectroscopy and Microscopy