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  • © 2007

Micromanufacturing

International Research and Development

  • A prestigious state of the art overview by a renowned institution

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xxxiv
  2. Introduction

    • Richard E. DeVor, Kornel F. Ehmann
    Pages 1-9
  3. Design

    • Martin L. Culpepper, Thomas R. Kurfess
    Pages 11-28
  4. Materials

    • David Bourell, Kamlakar Rajurkar
    Pages 29-52
  5. Processes

    • Kamlakar Rajurkar, Marc Madou
    Pages 53-87
  6. Metrology, Sensors and Control

    • Thomas R. Kurfess, Thom J. Hodgson
    Pages 89-109
  7. Non-lithography Applications

    • Marc Madou
    Pages 111-120
  8. Back Matter

    Pages 131-362

About this book

We have come to know that our ability to survive and grow as a nation to a very large degree depends upon our sci- tific progress. Moreover, it is not enough simply to keep abreast of the rest of the world in scientific matters. We 1 must maintain our leadership. President Harry Truman spoke those words in 1950, in the aftermath of World War II and in the midst of the Cold War. Indeed, the scientific and engineering leadership of the United States and its allies in the twentieth century played key roles in the successful outcomes of both World War II and the Cold War, sparing the world the twin horrors of fascism and tota- tarian communism, and fueling the economic prosperity that followed. - day, as the United States and its allies once again find themselves at war, President Truman’s words ring as true as they did a half-century ago. The goal set out in the Truman Administration of maintaining leadership in s- ence has remained the policy of the U. S. government to this day. Dr. John Marburger, the Director of the Office of Science and Technology (OSTP) in the Executive Office of the President, made remarks to that effect during 2 his confirmation hearings in October 2001. The United States needs metrics for measuring its success in meeting this goal of maintaining leadership in science and technology.

Authors and Affiliations

  • Northwestern University, Evanston, USA

    Kornel F. Ehmann

  • University of Texas, Austin, USA

    David Bourell

  • Massachusetts Institute of Technology, Camridge, USA

    Martin L. Culpepper

  • North Carolina State University, Raleigh, USA

    Thom J. Hodgson

  • Clemson University, Clemson, USA

    Thomas R. Kurfess

  • University of California, Irvine, USA

    Marc Madou

  • University of Nebraska, Lincoln, USA

    Kamlakar Rajurkar

  • University of Illinois, Urbana, USA

    Richard Devor

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access