Editors:
Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 151)
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Table of contents (41 papers)
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Front Matter
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Noise Sources
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Noise in Nanoscale Devices
About this book
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.
The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
Editors and Affiliations
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Brno University of Technology, Brno, Czech Republic
Josef Sikula
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Ioffe Institute of Russian Academy of Sciences, St. Petersburg, Russia
Michael Levinshtein
Bibliographic Information
Book Title: Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
Editors: Josef Sikula, Michael Levinshtein
Series Title: NATO Science Series II: Mathematics, Physics and Chemistry
DOI: https://doi.org/10.1007/1-4020-2170-4
Publisher: Springer Dordrecht
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media B.V. 2004
Hardcover ISBN: 978-1-4020-2168-8Published: 08 July 2004
Softcover ISBN: 978-1-4020-2169-5Published: 08 July 2004
eBook ISBN: 978-1-4020-2170-1Published: 21 February 2006
Series ISSN: 1568-2609
Edition Number: 1
Number of Pages: X, 368
Topics: Measurement Science and Instrumentation, Optical and Electronic Materials, Electrical Engineering