Skip to main content
Book cover

Trapped Particles and Fundamental Physics

  • Book
  • © 2002

Overview

Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 51)

This is a preview of subscription content, log in via an institution to check access.

Access this book

eBook USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (12 chapters)

Keywords

About this book

Fundamental physics with trapped particles (ions, atoms or molecules) rep­ resents one of the most challenging and promising fields of investigation, with impressive results during this last decade. The use of both particle trapping and laser cooling techniques, together with traditional techniques of atomic physics, represents a powerlul tool of investigation for a wide range of fields. Experiments spanning very high resolution spectroscopy to Bose-Einstein condensation, tests of the Standard Model ofelectroweak interactions to precise mass measurements, detailed analysis of ~ decay to QED tests have been presented by leading scientists who reported the most recent results and discussed the perspectives in the different fields. During the ten working days of the School, 39 lecturers, 6 seminars and two poster sessions have been organized by offering to the attendants a.complete pic­ ture of the present research status about the new frontiers of atomic physics. L. Caneschi gave a general overview of the Standard Model of electroweak interac­ tions. He pointed out the achievements and the limits of validity of the model.

Editors and Affiliations

  • Institute of Automation and Electrometry, Novosibirsk, Russia

    S. N. Atutov

  • Dipartimento di Fisica, Università di Ferrara, Italy

    R. Calabrese

  • Dipartimento di Fisica, Università di Siena, Italy

    L. Moi

Bibliographic Information

Publish with us